Наноточки и нанослои силицидов, германидов и станнидов магния в кремнии и германии и наногетероструктурах на их основе
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1.Mg2Sn heterostructures on Si(111) substrate
- 关键词:
- MgSn nanocrystals grown in silicon; Thermoelectric materials; Stabilityof nanostructures grown in silicon;THERMOELECTRIC PROPERTIES; MG2SI1-XGEX; MAGNESIUM
- Dozsa, L.;Galkin, N. G.;Pecz, B.;Osvath, Z.;Zolnai, Zs.;Nemeth, A.;Galkin, K. N.;Chernev, I. M.;Dotsenko, S. A.
- 《APPLIED SURFACE SCIENCE》
- 2017年
- 405卷
- 期
- 期刊
Thin un-doped and Al doped polycrystalline Mg-stannide films consisting mainly of Mg2S semiconductor phase have been grown by deposition of Sn-Mg multilayers on Si(111) p-type wafers at room temperature and annealing at 150 degrees C. Rutherford backscattering measurement spectroscopy (RBS) were used to determine the amount of Mg and Sn in the structures. Raman spectroscopy has shown the layers contain Mg2Sn phase. Cross sectional transmission electron microscopy (XTEM) measurements have identified Mg2Sn nanocrystallites in hexagonal and cubic phases without epitaxial orientation with respect to the Si(111) substrate. Significant oxygen concentration was found in the layer both by RBS and TEM. The electrical measurements have shown laterally homogeneous conductivity in the grown layer. The undoped Mg2Sn layers show increasing resistivity with increasing temperature indicating the scattering process dominates the resistance of the layers, i.e. large concentration of point defects was generated in the layer during the growth process. The Al doped layer shows increase of the resistance at low temperature caused by freeze out of free carriers in the Al doped Mg2Sn layer. The measurements indicate the necessity of protective layer grown over the Mg2Sn layers, and a short time delay between sample preparation and cross sectionalTEM analysis, since the unprotected layer is degraded by the interaction with the ambient. (C) 2017 Elsevier B.V. All rights reserved.
...2.MgSn-2 heterostructures on Si(111) substrate
- 关键词:
- Binary alloys ; Substrates ; Film preparation ; High resolution transmission electron microscopy ; Rutherford backscattering spectroscopy ; Point defects ; Tin alloys ; Silicon wafers ; Temperature;Backscattering measurement ; Cross;sectional transmission electron microscopy ; Electrical measurement ; Epitaxial orientations ; Increasing temperatures ; Oxygen concentrations ; Semiconductor phase ; Thermo;Electric materials
- zsaL.;GalkinN.G.;czB.;thZ.;ZolnaiZs.;methA.;GalkinK.N.;ChernevI.M.;DotsenkoS.A.
- 《Applied Surface Science》
- 2017年
- 405卷
- 期
- 期刊
Thin un-doped and Al doped polycrystalline Mg-stannide films consisting mainly of Mg2Sn semiconductor phase have been grown by deposition of Sn-Mg multilayers on Si(111) p-type wafers at room temperature and annealing at 150 °C. Rutherford backscattering measurement spectroscopy (RBS) were used to determine the amount of Mg and Sn in the structures. Raman spectroscopy has shown the layers contain Mg2Sn phase. Cross sectional transmission electron microscopy (XTEM) measurements have identified Mg2Sn nanocrystallites in hexagonal and cubic phases without epitaxial orientation with respect to the Si(111) substrate. Significant oxygen concentration was found in the layer both by RBS and TEM. The electrical measurements have shown laterally homogeneous conductivity in the grown layer. The undoped Mg2Sn layers show increasing resistivity with increasing temperature indicating the scattering process dominates the resistance of the layers, i.e. large concentration of point defects was generated in the layer during the growth process. The Al doped layer shows increase of the resistance at low temperature caused by freeze out of free carriers in the Al doped Mg2Sn layer. The measurements indicate the necessity of protective layer grown over the Mg2Sn layers, and a short time delay between sample preparation and cross sectionalTEM analysis, since the unprotected layer is degraded by the interaction with the ambient. © 2017 Elsevier B.V.
...3.Non-doped and doped Mg stannide films on Si(111) substrates: Formation, optical, and electrical properties
- 关键词:
- MG2SI SINGLE CRYSTALS; THERMOELECTRIC PROPERTIES; MAGNESIUM STANNIDE;SEMICONDUCTING PROPERTIES; TEMPERATURE-DEPENDENCE; SOLID SOLUTIONS;MG2SI1-XGEX; SILICIDE; CONDUCTIVITY; MG2SI-MG2SN
- Galkin, Nikolay G.;Galkin, Konstantin N.;Goroshko, Dmitrii L.;Chernev, Igor M.;Shevlyagin, Alexander V.;Dozsa, Laszlo;Osvath, Zoltan;Pecz, Bela
- 《ICSS Silicide Conference》
- 2015年
- JUL 19-21, 2014
- Tokyo Univ Sci, Tokyo, JAPAN
- 会议
Thin (45-50 nm) non-doped and doped (by Sb and Al) polycrystalline Mg stannide films consisting mainly of Mg2Sn semiconductor phase and containing small quantity of Mg2Si phase have been grown by multiple layer deposition at room temperature and single step annealing at 150 degrees C of the (Sn-Mg) bi-layers on Si(111) n-type wafers with 7.5 Omega cm resistivity. Optical spectroscopy data have shown that the grown Mg stannide films is a semiconductor with direct band gap of 0.17 +/- 0.03 eV, with second and third direct interband transitions at 0.34 +/- 0.02 and 0.45 +/- 0.04 eV. An undispersed refraction index: n(0) = 3.78 +/- 0.06 was calculated from phonon energy dependence of the refraction index of the grown films in the 0.12-0.20 eV energy range. Temperatures dependent Hall effect measurements have revealed about 0.28 eV electrical band gap value in the films. (C) 2015 The Japan Society of Applied Physics
...4.Formation of Mg silicides on amorphous Si. Origin and role of high pressure in the film growth
- 关键词:
- Inorganic compounds; Semiconductors; EELS; TEM; Phase transition
- Dotsenko, S. A.;Gouralnik, A. S.;Galkin, N. G.;Galkin, K. N.;Gutakovski, A. K.;Neklyudova, M. A.
- 《MATERIALS CHEMISTRY AND PHYSICS》
- 2014年
- 148卷
- 3期
- 期刊
Growth of Mg film on amorphous Si (a-Si) at room temperature in UHV conditions was studied in situ with optical differential reflection spectroscopy and electron energy loss spectroscopy. The phase composition of the film was also studied by high-resolution transmission electron microscopy. The mechanism of suicide film growth on a-Si is considered. The origin of internal stress within the growing film and its role in the silicide film growth process are discussed. Due to high pressure occurring within the growing film, the first phase to form is the hexagonal suicide phase h-Mg2Si. According to the DRS data, the phase h-Mg2Si is semiconducting. The new peak in the differential reflectance spectrum is assigned to the h-Mg2Si. At later stages of Mg deposition the cubic silicide phase c-Mg2Si grows. (C) 2014 Elsevier B.V. All rights reserved.
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