4D-STEM:a powerful technique to study electron-beam-sensitive materials in the transmission electron microscope

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巴(略)罗(略)金(略)P(略))

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E(略)n(略)b(略)o(略)i(略)

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C(略)r(略)a(略)n(略)d(略)e(略)i(略)e(略)n(略)i(略) (略)e(略)i(略)i(略)t(略)o(略) (略)n(略),(略)n(略)g(略)e(略)o(略)ã(略)a(略)n(略)S(略)r(略)l

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2(略)

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2(略)1(略)-(略)

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0(略)美(略)

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E(略)n(略)i(略)

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S(略)l(略)h(略) (略)o(略)R(略)a(略) (略)e(略)h(略)P(略)-(略)t(略)

关键词

C(略)m(略)s(略)N(略)t(略)o(略)i(略) (略)o(略)i(略);(略)l(略) (略)o(略) (略)e(略)i(略)e(略)i(略) (略)n(略)i(略)e(略)á(略) (略)e(略)a(略)e(略) (略)a(略)i(略) (略)o(略)r(略)r(略)s(略)C(略)l(略) (略)i(略)s(略)i(略)l(略)ô(略)a(略) (略)n(略)s(略) (略)

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T(略)a(略)y(略)o(略)g(略) (略)z(略)a(略) (略)a(略)D(略)n(略)r(略)s(略)

参与机构

F(略)c(略)g(略)n(略)m(略)l(略),(略)m(略)

项目标书摘要:Th(略)demand fo(略)ials and (略)ment of t(略)ties have(略)ed by the(略)of charac(略)tools.Amo(略)nsmission(略)icroscopy(略)en highli(略)o the pos(略) joining (略) spectros(略)tructural(略)dditional(略)ovement o(略)solution (略)l aberrat(略)ion and t(略)ent of in(略)e holders(略)crucial f(略)g new mat(略)behaviors(略)he develo(略)w cameras(略)ect detec(略)high dyna(略)or scanni(略)allowed t(略)on of fou(略)al data f(略)nt sample(略) those se(略)the elect(略)e 4D data(略)atial ima(略) each pix(略)mage of t(略) scatteri(略)eciprocal(略)D).This w(略)ata are r(略)rmation,i(略)gnatures (略)l structu(略)ion,defor(略)electroma(略)ds.We int(略)y the rol(略)amounts o(略) nanopart(略)e ITO sin(略)ared with(略)n2O3.We e(略)the 4D-ST(略)nt will s(略)n the sin(略)he nanosc(略)tance,if (略)rains tha(略)ially ind(略)e elimina(略)others ha(略)ification(略)so study (略)nsitive t(略)ron beam,(略)difficult(略) results (略)tional ST(略)citing ex(略)tend to s(略) perovski(略)g on surf(略)ty and st(略)tails)sin(略)e technol(略)rtance fo(略)ls.The st(略)different(略)ll allow (略)ntation o(略)EM techni(略)no for in(略)tern user(略)microscop(略)s for a w(略)f samples(略)t ER-C wi(略)the exper(略) to carry(略)oject sin(略) group ha(略)ledge in (略) data ana(略)rocessing(略)

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